Question: We are having certain batches of PC boards exhibiting micro voiding at the copper-lead free intermetallic region after thermal stress. Can you give me some background on this issue, as we are trying to determine the root cause of this problem?
Answer: IMC Microvoids, as defined in IPC-7095C Design and Assembly Process Implementation for BGAs, on page103. In the section 7.5.3.5 on IMC Microvoids it states:
“… IMC Microvoids occur within the Intermetallic Compound (IMC) formed between copper and high tin solders, including SAC and tin/lead solders. These IMC Microvoids do not form immediately after the soldering process, but after aging at high temperatures of during temperature cycling of the solder joints. The true root cause is still under investigation, but a Kirkendall voiding mechanism may play a part. These voids can affect solder joint reliability, particularly in instances when brittle fracture is initiated within the IMC during drop or mechanical hock to the solder joint. Doping the solder with certain elements such as zinc is one way to diminish the amount of these IMC microvoids.”The following was adapted from The Discovery and Acceptance of the Kirkendall Effect: The Result of a Short Research Career, by Hideo Nakajima, and found at the following website:
http://www.tms.org/pubs/journals/JOM/9706/Nakajima-9706.html
“In 1947, Ernest Kirkendall reported the results of experiments on the interdiffusion between copper and zinc in brass and observed the movement of the interface between theHere is another reference to these types of voids:
http://ecadigitallibrary.com/pdf/56thECTC/s06p7lr.pdf
Effect of Intermetallic and Kirkendall Voids Growth on Board Level Drop Reliability
for SnAgCu Lead-free BGA Solder Joint
Luhua Xu and John H.L. Pang
School of Mechanical & Aerospace Engineering,
Nanyang Technological University